multiple patterning 예문
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- Consequently, there are more sources of variations and possible yield loss in multiple patterning.
- TSMC is deploying 7 nm in 2017 with multiple patterning; specifically, pitch-splitting, down to 40 nm pitch.
- This 10 nm design rule is considered likely to be realized by multiple patterning, given the difficulty of implementing EUV lithography.
- Hence, multiple patterning with immersion lithography has been deployed for volume manufacturing, while deployment of EUV is expected in 2018 2020.
- The 5 nm node ( 22 nm pitch ) would likewise be expected to use multiple patterning already being developed for immersion lithography.